Techniques for providing a direct injection semiconductor memory device

ABSTRACT

Techniques for providing a direct injection semiconductor memory device are disclosed. In one particular exemplary embodiment, the techniques may be realized as a method for biasing a direct injection semiconductor memory device. The method may comprise applying a first voltage potential to a first N-doped region via a bit line and applying a second voltage potential to a second N-doped region via a source line. The method may also comprise applying a third voltage potential to a word line, wherein the word line is spaced apart from and capacitively coupled to a body region that is electrically floating and disposed between the first N-doped region and the second N-doped region. The method may further comprise applying a fourth voltage potential to a P-type substrate via a carrier injection line.

CROSS-REFERENCE TO RELATED APPLICATIONS

This patent application is a continuation of U.S. patent applicationSer. No. 12/768,322, filed Apr. 27, 2010, which claims priority to U.S.Provisional Patent Application No. 61/173,014, filed Apr. 27, 2009, eachof which is hereby incorporated by reference herein in its entirety.

FIELD OF THE DISCLOSURE

The present disclosure relates generally to semiconductor memory devicesand, more particularly, to techniques for providing a direct injectionsemiconductor memory device.

BACKGROUND OF THE DISCLOSURE

The semiconductor industry has experienced technological advances thathave permitted increases in density and/or complexity of semiconductormemory devices. Also, the technological advances have allowed decreasesin power consumption and package sizes of various types of semiconductormemory devices. There is a continuing trend to employ and/or fabricateadvanced semiconductor memory devices using techniques, materials, anddevices that improve performance, reduce leakage current, and enhanceoverall scaling. Silicon-on-insulator (SOI) and bulk substrates areexamples of materials that may be used to fabricate such semiconductormemory devices. Such semiconductor memory devices may include, forexample, partially depleted (PD) devices, fully depleted (FD) devices,multiple gate devices (for example, double, triple gate, or surroundinggate), and Fin-FET devices.

A semiconductor memory device may include a memory cell having a memorytransistor with an electrically floating body region wherein electricalcharges may be stored. When excess majority electrical charges carriersare stored in the electrically floating body region, the memory cell maystore a logic high (e.g., binary “1” data state). When the electricalfloating body region is depleted of majority electrical charge carriers,the memory cell may store a logic low (e.g., binary “0” data state).Also, a semiconductor memory device may be fabricated onsilicon-on-insulator (SOI) substrates or bulk substrates (e.g., enablingbody isolation). For example, a semiconductor memory device may befabricated as a three-dimensional (3-D) device (e.g., multiple gatedevices, Fin-FETs, recessed gates and pillars).

In one conventional technique, the memory cell of the semiconductormemory device may be read by applying bias signals to a source/drainregion and/or a gate of the memory transistor. As such, a conventionalreading technique may involve sensing an amount of currentprovided/generated by/in the electrically floating body region of thememory cell in response to the application of the source/drain region orgate bias signals to determine a data state stored in the memory cell.For example, the memory cell may have two or more different currentstates corresponding to two or more different logical states (e.g., twodifferent current conditions/states corresponding to two different logicstates: a binary “0” data state and a binary “1” data state).

In another conventional technique, the memory cell of the semiconductormemory device may be written to by applying bias signals to thesource/drain region(s) and/or the gate of the memory transistor. Assuch, a conventional writing technique may result in anincrease/decrease of majority charge carriers in the electricallyfloating body region of the memory cell which, in turn, may determinethe data state of the memory cell. An increase of majority chargecarriers in the electrically floating body region may result from impactionization, band-to-band tunneling (gate-induced drain leakage “GIDL”),or direct injection. A decrease of majority charge carriers in theelectrically floating body region may result from charge carriers beingremoved via drain region charge carrier removal, source region chargecarrier removal, or drain and source region charge carrier removal, forexample, using back gate pulsing.

Often, conventional reading and/or writing operations may lead torelatively large power consumption and large voltage potential swingswhich may cause disturbance to unselected memory cells in thesemiconductor memory device. Also, pulsing between positive and negativegate biases during read and write operations may reduce a net quantityof majority charge carriers in the electrically floating body region ofthe memory cell in the semiconductor memory device, which, in turn, mayresult in an inaccurate determination of the state of the memory cell.Furthermore, in the event that a bias is applied to the gate of thememory transistor that is below a threshold voltage potential of thememory transistor, a channel of minority charge carriers beneath thegate may be eliminated. However, some of the minority charge carriersmay remain “trapped” in interface defects. Some of the trapped minoritycharge carriers may recombine with majority charge carriers, which maybe attracted to the gate as a result of the applied bias. As a result,the net quantity of majority charge carriers in the electricallyfloating body region may be reduced. This phenomenon, which is typicallycharacterized as charge pumping, is problematic because the net quantityof majority charge carriers may be reduced in the electrically floatingbody region of the memory cell, which, in turn, may result in aninaccurate determination of the state of the memory cell.

In view of the foregoing, it may be understood that there may besignificant problems and shortcomings associated with conventionaltechniques for fabricating and/or operating semiconductor memorydevices.

SUMMARY OF THE DISCLOSURE

Techniques for providing a direct injection semiconductor memory deviceare disclosed. In one particular exemplary embodiment, the techniquesmay be realized as a method for biasing a direct injection semiconductormemory device. The method may comprise applying a first voltagepotential to a first N-doped region via a bit line and applying a secondvoltage potential to a second N-doped region via a source line. Themethod may also comprise applying a third voltage potential to a wordline, wherein the word line is spaced apart from and capacitivelycoupled to a body region that is electrically floating and disposedbetween the first N-doped region and the second N-doped region. Themethod may further comprise applying a fourth voltage potential to aP-type substrate via a carrier injection line. In accordance with otheraspects of this particular exemplary embodiment, the method may furthercomprise increasing the third voltage potential applied to the word linefrom the third voltage potential applied to the word line during a holdoperation to perform a read operation.

In accordance with further aspects of this particular exemplaryembodiment, the method may further comprise increasing the secondvoltage potential applied to the source line from the second voltagepotential applied to the source line during a hold operation to performa read operation.

In accordance with additional aspects of this particular exemplaryembodiment, the method may further comprise maintaining the secondvoltage potential applied to the source line during a hold operation toperform a read operation.

In accordance with yet another aspect of this particular exemplaryembodiment, the method may further comprise increasing the first voltagepotential applied to the bit line from the first voltage potentialapplied to the bit line during a hold operation in order to reduce adisturbance during a read operation.

In accordance with other aspects of this particular exemplaryembodiment, the method may further comprise increasing the third voltagepotential applied to the word line from the third voltage potentialapplied to the word line during a hold operation to perform a writelogic high operation.

In accordance with further aspects of this particular exemplaryembodiment, the method may further comprise lowering the second voltagepotential applied to the source line from the second voltage potentialapplied to the source line during a hold operation to perform a writelogic high operation.

In accordance with additional aspects of this particular exemplaryembodiment, the second voltage potential applied to the source line toperform the write logic high operation may be lowered to forward bias ajunction between the second N-doped region and the P-type substrate.

In accordance with yet another aspect of this particular exemplaryembodiment, the method may further comprise increasing the third voltagepotential applied to the respective word line from the third voltagepotential applied to the respective word line during a hold operation toperform a write logic low operation.

In accordance with other aspects of this particular exemplaryembodiment, the method may further comprise increasing the secondvoltage potential applied to the source line from the second voltagepotential applied to the source line during a hold operation to performa write logic low operation.

In accordance with further aspects of this particular exemplaryembodiment, the method may further comprise maintaining the secondvoltage potential applied to the source line during a hold operation toperform a write logic low operation.

In accordance with additional aspects of this particular exemplaryembodiment, the method may further comprise maintaining the firstvoltage potential applied to the bit line during a hold operation toperform a write logic low operation.

In accordance with yet another aspect of this particular exemplaryembodiment, the method may further comprise increasing the first voltagepotential applied to the bit line during a write logic low operationfrom the first voltage potential applied to the bit line during a holdoperation to maintain a logic high stored in the memory cell.

In accordance with other aspects of this particular exemplaryembodiment, the second voltage potential applied to the source line maybe equal to the fourth voltage potential applied to the carrierinjection line during a hold operation.

In another particular exemplary embodiment, the techniques may realizedas a direct injection semiconductor memory device comprising a firstN-doped region coupled to a bit line and a second N-doped region coupledto a source line. The direct injection semiconductor memory device mayalso comprise a body region spaced apart from and capacitively coupledto a word line, wherein the body region is electrically floating anddisposed between the first N-doped region and the second N-doped region.the direct injection semiconductor memory device may further comprise aP-type substrate coupled to a carrier injection line.

In accordance with other aspects of this particular exemplaryembodiment, the first N-doped region, the body region, and the secondN-doped region may form a bipolar transistor.

In accordance with further aspects of this particular exemplaryembodiment, the second N-doped region and the P-type substrate may forma PN junction diode.

In accordance with additional aspects of this particular exemplaryembodiment, the bit line may extend from the first N-doped regionperpendicular to at least a portion of at least one of the source line,the word line, and the carrier injection line.

In accordance with yet another aspect of this particular exemplaryembodiment, the word line may extend from near the body regionhorizontally parallel to at least a portion of at least one of thesource line and the carrier injection line.

In accordance with other aspects of this particular exemplaryembodiment, the source line may extend from the second N-doped regionparallel to at least one of the word line and the carrier injectionline.

In another exemplary embodiment, the techniques may be realized as amethod for biasing a direct injection semiconductor memory device. Themethod may comprise applying a first voltage potential to a firstP-doped region via a bit line and applying a second voltage potential toa second P-doped region via a source line. The method may also compriseapplying a third voltage potential to a word line, wherein the word lineis spaced apart from and capacitively coupled to a body region that iselectrically floating and disposed between the first P-doped region andthe second P-doped region. The method may further comprise applying afourth voltage potential to an N-type substrate via a carrier injectionline.

In another exemplary embodiment, the techniques may be realized as adirect injection semiconductor memory device that may comprise a firstP-doped region coupled to a bit line and a second P-doped region coupledto a source line. The direct injection semiconductor memory device mayalso comprise a body region spaced apart from and capacitively coupledto a word line, wherein the body region is electrically floating anddisposed between the first N-doped region and the second N-doped region.The direct injection semiconductor memory device may further comprise aP-type substrate coupled to a carrier injection line.

The present disclosure will now be described in more detail withreference to exemplary embodiments thereof as shown in the accompanyingdrawings. While the present disclosure is described below with referenceto exemplary embodiments, it should be understood that the presentdisclosure is not limited thereto. Those of ordinary skill in the arthaving access to the teachings herein will recognize additionalimplementations, modifications, and embodiments, as well as other fieldsof use, which are within the scope of the present disclosure asdescribed herein, and with respect to which the present disclosure maybe of significant utility.

BRIEF DESCRIPTION OF THE DRAWINGS

In order to facilitate a fuller understanding of the present disclosure,reference is now made to the accompanying drawings, in which likeelements are referenced with like numerals. These drawings should not beconstrued as limiting the present disclosure, but are intended to beexemplary only.

FIG. 1 shows a block diagram of a semiconductor memory device includinga memory cell array, data write and sense circuitry, and memory cellselection and control circuitry in accordance with an embodiment of thepresent disclosure.

FIG. 2 shows a cross-sectional view and a schematic representation of amemory cell in the memory cell array shown in FIG. 1 in accordance withan embodiment of the present disclosure.

FIG. 3 shows a cross-sectional view and a schematic representation of atleast a portion of the memory cell array having the plurality of memorycells in accordance with an embodiment of the present disclosure.

FIGS. 4A and 4B show a schematic representation and control signalvoltage waveforms for performing a hold operation on a memory cell inaccordance with an embodiment of the present disclosure.

FIGS. 5A and 5B show a schematic representation and control signalvoltage waveforms for performing a read operation on a memory cell inaccordance with an embodiment of the present disclosure.

FIGS. 6A and 6B show a schematic representation and control signalvoltage waveforms for performing a read operation on a memory cell inaccordance with an alternative embodiment of the present disclosure.

FIGS. 7A and 7B show a schematic representation and control signalvoltage waveforms for performing a write logic high (e.g., binary “1”data state) operation on a memory cell in accordance with an embodimentof the present disclosure.

FIGS. 8A and 8B show a schematic representation and control signalvoltage waveforms for performing a write logic high (e.g., binary “1”data state) operation on a memory cell in accordance with an alternativeembodiment of the present disclosure.

FIGS. 9A and 9B show a schematic representation and control signalvoltage waveforms for performing a write logic low (e.g., binary “0”data state) operation on a memory cell in accordance with an embodimentof the present disclosure.

FIGS. 10A and 10B show a schematic representation and control signalvoltage waveforms for performing a write logic low (e.g., binary “0”data state) operation on a memory cell in accordance with an alternativeembodiment of the present disclosure.

DETAILED DESCRIPTION OF EXEMPLARY EMBODIMENTS

Referring to FIG. 1, there is shown a block diagram of a semiconductormemory device 10 comprising a memory cell array 20, data write and sensecircuitry 36, and memory cell selection and control circuitry 38 inaccordance with an embodiment of the present disclosure. The memory cellarray 20 may comprise a plurality of memory cells 12 each coupled to thememory cell selection and control circuitry 38 via a word line (WL) 28,a source line (CN) 30, and a carrier injection line (EP) 34, and to thedata write and sense circuitry 36 via a bit line (EN) 32. It may beappreciated that the source line (CN) 30 and the bit line (EN) 32 aredesignations used to distinguish between two signal lines and they maybe used interchangeably.

The data write and sense circuitry 36 may read data from and may writedata to selected memory cells 12. In an exemplary embodiment, the datawrite and sense circuitry 36 may include a plurality of data senseamplifiers. Each data sense amplifier may receive at least one bit line(EN) 32 and a current or voltage reference signal. For example, eachdata sense amplifier may be a cross-coupled type sense amplifier tosense a data state stored in a memory cell 12.

Each data sense amplifier may employ voltage and/or current sensingcircuitry and/or techniques. In an exemplary embodiment, each data senseamplifier may employ current sensing circuitry and/or techniques. Forexample, a current sense amplifier may compare current from a selectedmemory cell 12 to a reference current (e.g., the current of one or morereference cells). From that comparison, it may be determined whether theselected memory cell 12 stores a logic high (e.g., binary “1” datastate) or a logic low (e.g., binary “0” data state). It may beappreciated by one having ordinary skill in the art that various typesor forms of the data write and sense circuitry 36 (including one or moresense amplifiers, using voltage or current sensing techniques, to sensea data state stored in a memory cell 12) may be employed to read datastored in memory cells 12 and/or write data to memory cells 12.

The memory cell selection and control circuitry 38 may select and/orenable one or more predetermined memory cells 12 to facilitate readingdata therefrom and/or writing data thereto by applying control signalson one or more word lines (WL) 28, source lines (CN) 30, and/or carrierinjection lines (EP) 34. The memory cell selection and control circuitry38 may generate such control signals from address signals, for example,row address signals. Moreover, the memory cell selection and controlcircuitry 38 may include a word line decoder and/or driver. For example,the memory cell selection and control circuitry 38 may include one ormore different control/selection techniques (and circuitry therefor) toselect and/or enable one or more predetermined memory cells 12. Notably,all such control/selection techniques, and circuitry therefor, whethernow known or later developed, are intended to fall within the scope ofthe present disclosure.

In an exemplary embodiment, the semiconductor memory device 10 mayimplement a two step write operation whereby all the memory cells 12 ina row of memory cells 12 may be written to a predetermined data state byfirst executing a “clear” or a logic low (e.g., binary “0” data state)write operation, whereby all of the memory cells 12 in the row of memorycells 12 are written to logic low (e.g., binary “0” data state).Thereafter, selected memory cells 12 in the row of memory cells 12 maybe selectively written to the predetermined data state (e.g., a logichigh (binary “1” data state)). The semiconductor memory device 10 mayalso implement a one step write operation whereby selective memory cells12 in a row of memory cells 12 may be selectively written to either alogic high (e.g., binary “1” data state) or a logic low (e.g., binary“0” data state) without first implementing a “clear” operation. Thesemiconductor memory device 10 may employ any of the exemplary writing,preparation, holding, refresh, and/or reading techniques describedherein.

The memory cells 12 may comprise N-type, P-type and/or both types oftransistors. Circuitry that is peripheral to the memory array 20 (forexample, sense amplifiers or comparators, row and column addressdecoders, as well as line drivers (not illustrated herein)) may alsoinclude P-type and/or N-type transistors. Regardless of whether P-typeor N-type transistors are employed in memory cells 12 in the memory cellarray 20, suitable voltage potentials (for example, positive or negativevoltage potentials) for reading from and/or writing to the memory cells12 will be described further herein.

Referring to FIG. 2, there is shown a cross-sectional view and aschematic representation of a memory cell 12 of the memory cell array 20shown in FIG. 1 in accordance with an embodiment of the presentdisclosure. Each memory cell 12 may comprise a bipolar transistor 14 aand a diode 14 b. In an exemplary embodiment, the bipolar transistor 14a may be a NPN bipolar transistor or a PNP bipolar transistor and thediode 14 b may be a PN junction diode. In an exemplary embodiment, thebipolar transistor 14 a and the diode 14 b may share one or more commonregions. The NPN bipolar transistor 14 a may comprise an N+emitterregion 120, a P-base region 122, and an N+ collector region 124. Thediode 14 b may comprise the N+ region 124 and a P+ region 126. The N+region 120, the P− region 122, the N+ region 124, and/or the P+ region126 may be disposed in sequential contiguous relationship within apillar or fin configuration that may extend vertically from and/orperpendicularly to a plane defined by the P+ region 126. In an exemplaryembodiment, the P− region 122 may be an electrically floating bodyregion of the memory cell 12 configured to accumulate/store charges, andmay be spaced apart from and capacitively coupled to the word line (WL)28.

As shown in FIG. 2, the N+ emitter region 120 of the bipolar transistor14 a may be coupled to a corresponding bit line (EN) 32. In an exemplaryembodiment, the N+ emitter region 120 of the bipolar transistor 14 a maybe formed of a semiconductor material (e.g., silicon) comprising donorimpurities. For example, the N+ emitter region 120 may be formed of asilicon material doped with phosphorous or arsenic impurities. In anexemplary embodiment, the bit line (EN) 32 may be formed of a metallayer. In another exemplary embodiment, the bit line (EN) 32 may beformed of a polycide layer (e.g., a combination of a metal material anda silicon material). The bit line (EN) 32 may provide means foraccessing one or more selected memory cells 12 on a selected row of thememory cell array 20.

As also shown in FIG. 2, the P−base region 122 of the bipolar transistor14 a may be capacitively coupled to a corresponding word line (WL) 28.In an exemplary embodiment, the P− region 122 may be formed of asemiconductor material (e.g., silicon) comprising acceptor impurities.For example, the P− region 122 may be formed of a silicon material dopedwith boron impurities. The P− region 122 and the word line (WL) 28 maybe capacitively coupled via an insulating or dielectric material. In anexemplary embodiment, the word line (WL) 28 may be formed of a polycidelayer or a metal layer extending in a row direction of the memory cellarray 20.

As further shown in FIG. 2, the N+ region 124 of the memory cell 12 maybe coupled to a source line (CN) 30. In an exemplary embodiment, the N+region 124 may be formed of a semiconductor material (e.g., silicon)comprising donor impurities. For example, the N+ region 124 may beformed of a silicon material doped with phosphorous or arsenicimpurities. In an exemplary embodiment, the source line (CN) 30 may beformed of a polycide layer. In another exemplary embodiment, the sourceline (CN) 30 may be formed of a metal layer. The source line (CN) 30 mayreduce a disturbance in the memory cell 12. For example, the source line(CN) 30 may be formed of a metal layer and therefore may reduce a holedisturbance in the memory cell 12. The source line (CN) 30 may extendhorizontally in a row direction of the memory cell array 20, parallel tothe word line (WL) 28 and/or the carrier injection line (EP) 34, and maybe coupled to a plurality of memory cells 12 (e.g., a row of memorycells 12). For example, the source line (CN) 30, the word line (WL) 28,and/or the carrier injection line (EP) 34 may be arranged in differentplanes and configured to be parallel to each other. In an exemplaryembodiment, the source line (CN) 30 may be arranged in a plane between aplane containing the word line (WL) 28 and a plane containing thecarrier injection line (EP) 34.

As further shown in FIG. 2, the P+ region 126 of the diode 14 b may becoupled to the carrier injection line (EP) 34. The P+ region 126 may beformed of a semiconductor material (e.g., silicon) comprising acceptorimpurities. For example, the P+ region 126 may be formed of a siliconmaterial doped with boron impurities. In an exemplary embodiment, aplurality of P+ regions 126 may form a base of the memory cell array 20or a single P+ region 126 may form the base of the memory cell array 20.Also, the P+ 126 may be made in the form of a P-well of a bulk substrateof the memory cell array 20.

In an exemplary embodiment, the P+ region 126 may be configured as aninput region for charges to be stored in the P− region 122 of the memorycell 12. The charges to be stored in the P− region 122 of the memorycell 12 may be supplied by the carrier injection line (EP) 34 and inputinto the P− region 122 via the P+ region 126 and the N+ region 124.

The carrier injection line (EP) 34 may be formed of a polycide layer ora metal layer extending in a row direction of the memory cell array 20.For example, the carrier injection line (EP) 34 may extend horizontallyin parallel to the word line (WL) 28 and/or the source line (CN) 30, andmay be coupled to a plurality of memory cells 12 (e.g., a row of memorycells 12). For example, the carrier injection line (EP) 34 and the wordline (WL) 28 and/or the source line (CN) 30 may be arranged in differentplanes and configured to be parallel to each other. In an exemplaryembodiment, the carrier injection line (EP) 34 may be arranged in aplane below a plane containing the word line (WL) 28 and a planecontaining the source line (CN) 30.

Referring to FIG. 3, there is shown a cross-sectional view and aschematic representation of at least a portion of the memory cell array20 having a plurality of memory cells 12 in accordance with anembodiment of the present disclosure. As discussed above, each of thememory cells 12 may comprise a bipolar transistor 14 a and a PN junctiondiode 14 b coupled to each other. For example, the bipolar transistor 14a may be an NPN bipolar transistor or an PNP bipolar transistor. Asillustrated in FIG. 3, the bipolar transistor 14 a may be an NPN bipolartransistor and may share a common region (e.g., N-region) with the PNjunction diode 14 b. In another exemplary embodiment, the memorytransistor 14 a may be an PNP bipolar transistor and may share a commonregion (e.g., P-region) with the PN junction diode 14 b.

Each memory cell 12 may be coupled to a respective word line (WL) 28, arespective source line (CN) 30, a respective bit line (EN) 32, and arespective carrier injection line (EP) 34. Data may be written to orread from a selected memory cell 12 by applying suitable control signalsto a selected word line (WL) 28, a selected source line (CN) 30, aselected bit line (EN) 32, and/or a selected carrier injection line (EP)34. In an exemplary embodiment, each word line (WL) 28, source line (CN)30, and carrier injection line (EP) 34 may extend horizontally parallelto each other in a row direction. Each bit line (EN) 32 may extendvertically in a column direction perpendicular to each word line (WL)28, source line (CN) 30, and/or carrier injection line (EP) 34.

In an exemplary embodiment, one or more respective bit lines (EN) 32 maybe coupled to one or more data sense amplifiers (not shown) of the datawrite and sense circuitry 36 to read data states of one or more memorycells 12 in the column direction. A data state may be read from one ormore selected memory cells 12 by applying one or more control signals tothe one or more selected memory cells 12 via a selected word line (WL)28, a selected source line (CN) 30, and/or a selected carrier injectionline (EP) 34 in order to generate a voltage potential and/or a currentin the one or more selected memory cells 12. The generated voltagepotential and/or current may be output to the data write and sensecircuitry 36 via a corresponding bit line (EN) 32 in order to read adata state stored in each selected memory cell 12.

In the event that a data state is read from a selected memory cell 12via a selected bit line (EN) 32, then only the bit line (EN) 32 may becoupled to the data sense amplifier of the data write and sensecircuitry 36. In an exemplary embodiment, the data write and sensecircuitry 36 may be configured on opposite sides of the memory cellarray 20.

Also, a data state may be written to one or more selected memory cells12 by applying one or more control signals to the one or more selectedmemory cells 12 via a selected word line (WL) 28, a selected source line(CN) 30, a selected bit line (EN) 32, and/or a selected carrierinjection line (EP) 34. The one or more control signals applied to theone or more selected memory cells 12 via a selected word line (WL) 28, aselected source line (CN) 30, a selected bit line (EN) 32, and/or aselected carrier injection line (EP) 34 may control the bipolartransistor 14 a and/or the diode 14 b of each selected memory cell 12 inorder to write a desired data state to each selected memory cell 12.

The source line (CN) 30 may be subcircuits 302 of the memory cellselection and control circuitry 38 (e.g., driver, inverter, and/or logiccircuits). The carrier injection lines (EP) 34 may be driven bysubcircuits of the memory cell selection and control circuitry 38 (e.g.,driver, inverter, and/or logic circuits). The subcircuits coupled toeach carrier injection line (EP) 34 may be independent voltage driverslocated within and/or integrated with the memory cell selection andcontrol circuitry 38. To reduce an amount of area required by thesubcircuits of the memory cell selection and control circuitry 38, aplurality of carrier injection lines (EP) 34 of the memory cell array 20may be coupled to a single subcircuit within the memory cell selectionand control circuitry 38. In an exemplary embodiment, the subcircuits ofthe memory cell selection and control circuitry 38 may bias a pluralityof carrier injection lines (EP) 34 coupled together to different voltagepotentials and/or current levels (e.g., 0V, 1.0V, etc).

In an exemplary embodiment, during active operations (e.g., readoperation or write operation), the memory cell 12 (e.g., correspondingto bit line EN<0>32) located near the subcircuits (e.g., drivers) withinthe memory cell selection and control circuitry 38 may be activatedbefore the memory cells 12 (e.g., correspond to bit lines EN<1>, EN<2>,and EN<3>) located farther from the subcircuits (e.g., drivers) withinthe memory cell selection and control circuitry 38. The memory cell 12(e.g., corresponding to bit line EN<0>32) located near the subcircuits(e.g., drivers) within the memory cell selection and control circuitry38 may impact a voltage potential and/or current applied to the sourceline (CN) 30. For example, when control signals are applied to thememory cell 12 (e.g., corresponding to bit line EN<0>32) located nearthe subcircuits (e.g., drivers) within the memory cell selection andcontrol circuitry 38, thereby turning the bipolar transistor 14 a of thememory cell 12 to an “ON” state, the actions performed by the bipolartransistor 14 a of the memory cell 12 may impact a voltage potentialand/or current applied to the source line (CN) 30 (e.g., raise or lowerthe voltage potential). Thus, the memory cell 12 (e.g., corresponding tobit line EN<0>32) located near the subcircuits (e.g., drivers) withinthe memory cell selection and control circuitry 38 may impact anoperation performed by the memory cells 12 located farther from thesubcircuits (e.g., drivers) within the memory cell selection and controlcircuitry 38.

Referring to FIGS. 4A and 4B, there are shown a schematic representationand control signal voltage waveforms for performing a hold operation ona memory cell in accordance with an embodiment of the presentdisclosure. Prior to performing one or more active operations, controlsignals may be configured to perform a hold operation in order tomaintain a data state (e.g., a logic high (binary “1” data state) or alogic low (binary “0” data state)) stored in the memory cell 12. Inparticular, the control signals may be configured to perform a holdoperation in order to maximize a retention time of a data state (e.g., alogic low (binary “0” data state) and/or a logic high (binary “1” datastate)) stored in the memory cell 12. Also, the control signals for thehold operation may be configured to eliminate or reduce activities orfields (e.g., electrical fields between junctions which may lead toleakage of charges) within the memory cell 12.

In an exemplary embodiment, during a hold operation, a negative voltagepotential may be applied to the word line (WL) 28 that may becapacitively coupled to the P− region 122 of the memory cell 12, while avoltage potential applied to the N+ region 120 may be maintained atapproximately 0V. The voltage potential applied to the N+ region 124 maybe the same as the voltage potential applied to the P+ region 126. Forexample, the negative voltage potential applied to the word line (WL) 28(e.g., capacitively coupled to the P− region 122 of the memory cell 12)may be −1.0V, the voltage potentials applied to the N+ region 124 andthe P+ region 126 may range between 0.7V to 1.0V. During the holdoperation, the junction between the N+ region 124 and the P− region 122and the junction between the N+ region 120 and the P− region 122 may bereverse biased in order to retain a data state (e.g., a logic high(binary “1” data state) or a logic low (binary “0” data state)) storedin the memory cell 12.

Referring to FIGS. 5A and 5B, there are shown a schematic representationand control signal voltage waveforms for performing a read operation ona memory cell in accordance with an embodiment of the presentdisclosure. In an exemplary embodiment, a read operation may involvecontrol signals that are configured to read a data state (e.g., a logiclow (binary “0” data state) and/or a logic high (binary “1” data state))stored in one or more selected memory cells 12 of one or more selectedrows of the memory cell array 20. The control signals may be configuredto predetermined voltage potentials to implement a read operation viathe bit line (EN) 32. In an exemplary embodiment, a voltage potentialapplied to the word line (WL) 28 (e.g., capacitively coupled to the P−region 122) and/or a voltage potential applied to the N+ region 124 viathe source line (CN) 30 may be raised to predetermined voltagepotentials in order to read a data state stored in each respectivememory cell 12. For example, the voltage potential applied to the wordline (WL) 28 (e.g., capacitively coupled to the P− region 122 of thememory cell 12) may be raised to −0.5V from −1.0V, while the voltagepotential applied to the N+ region 124 of the memory cell 12 via thesource line (CN) 30 may be raised to 1.1V from 0.7V. The voltagepotential applied to the carrier injection line (EP) 34 may bemaintained at 0.7V.

In an exemplary embodiment, during the read operation, the voltagepotential applied to the word line (WL) 28 (e.g., capacitively coupledto the P− region 122 of the memory cell 12) may be raised to −0.5V andthe voltage potential applied to the source line (CN) 30 may be raisedto 1.1V. Under such biasing, the junction between the P− region 122 andthe N+ region 120 may become forward biased. Also, under such biasing,the junction between the P− region 122 and the N+ region 124 may bereverse biased or become weakly forward biased (e.g., above a reversebias voltage and below a forward bias threshold voltage, or a voltagepotential at a p-diffusion region in the P− region 122 may be higherthan a voltage potential at an n-diffusion region in the N+ region 124).A voltage potential or current may be generated when forward biasing thejunction between the P− region 122 and the N+ region 120. The voltagepotential or current generated may be output to a data sense amplifiervia the bit line (EN) 32 coupled to the N+ region 120. An amount ofvoltage potential or current generated may be representative of a datastate (e.g., a logic low (binary “0” data state) and/or a logic high(binary “1” data state)) stored in the memory cell 12.

In an exemplary embodiment, when a logic low (e.g., binary “0” datastate) is stored in the memory cell 12 (e.g., corresponding to bit line(EN<1>) 32), the junction between the P− region 122 and the N+ region120 may remain reverse biased or become weakly forward biased (e.g.,above a reverse bias voltage and below a forward bias threshold voltage,or a voltage potential at a p-diffusion region in the P− region 122 maybe higher than a voltage potential at an n-diffusion region in the N+region 124). A small amount of voltage potential or current or novoltage potential or current (e.g., compared to a reference voltagepotential or current) may be generated when the junction between the P−region 122 and the N+ region 120 is reverse biased or weakly forwardbiased. A data sense amplifier in the data write and sense circuitry 36may detect the small amount of voltage potential or current or novoltage potential or current via the bit line (EN<1>) 32 coupled to theN+ region 120.

In another exemplary embodiment, when a logic high (e.g., binary “1”data state) is stored in the memory cell 12 (e.g., corresponding to thebit line (EN<0>) 32), the junction between the P− region 122 and the N+region 120 may be forward biased. A larger amount of voltage potentialor current (e.g., compared to a reference voltage potential or current)may be generated when the junction between the P− region 122 and the N+region 120 is forward biased.

A data sense amplifier in the data write and sense circuitry 36 maydetect the larger amount of voltage potential or current via the bitline (EN<0>) 32 coupled to the N+ region 120.

During one or more active operations (e.g., read operation, writeoperation, sense operation, preparation to start/end operation, and/orrefresh operation), voltage potentials may be applied to every memorycell 12 along an active row via a corresponding word line (WL) 28, acorresponding source line (CN) 30, and/or a corresponding carrierinjection line (EP) 34. However, while the active operations may beperformed on one or more selected memory cells 12 along the active row,one or more unselected memory cells 12 (e.g., corresponding to bit lines(EN<2>) and (EN<3>) 32) along the active row may experience adisturbance caused by the voltage potentials applied via thecorresponding word line (WL) 28, the corresponding source line (CN) 30,and/or the corresponding carrier injection line (EP) 34 during theactive operations. In order to reduce a disturbance experienced by theone or more unselected memory cells 12 (e.g., corresponding to bit lines(EN<2>) and (EN<3>) 32) along the active row, a masking operation may beperformed on the one or more unselected memory cells 12.

In an exemplary embodiment, during a masking operation, a voltagepotential may be applied to the one or more unselected memory cells 12on an active row via corresponding bit lines (EN<2>) and (EN<3>) 32. Thevoltage potential applied via the corresponding bit lines (EN<2>) and(EN<3>) 32 to the one or more unselected memory cells 12 on the activerow may be raised to a predetermined voltage potential. In an exemplaryembodiment, the voltage potential applied to the corresponding bit lines(EN<2>) and (EN<3>) 32 associated with the one or more unselected memorycells 12 along the active row may be 1.1V in order to reduce adisturbance caused by the other voltage potentials applied during theactive operations.

Referring to FIGS. 6A and 6B, there are shown a schematic representationand control signal voltage waveforms for performing a read operation ona memory cell in accordance with an alternative embodiment of thepresent disclosure. In an exemplary embodiment, a read operation mayinvolve control signals that are configured to read a data state (e.g.,a logic low (binary “0” data state) and/or a logic high (binary “1” datastate)) stored in one or more selected memory cells 12 of one or moreselected rows of the memory cell array 20. The control signals may beconfigured to predetermined voltage potentials to implement a readoperation via the bit line (EN) 32. In an exemplary embodiment, avoltage potential applied to the word line (WL) 28 (e.g., capacitivelycoupled to the P− region 122) may be raised to a predetermined voltagepotential. A voltage potential applied to the N+ region 124 via thesource line (CN) 30 may be maintained at a predetermined voltagepotential in order to read a data state stored in the memory cell 12.For example, the voltage potential applied to the word line (WL) 28(e.g., capacitively coupled to the P− region 122 of the memory cell 12)may be raised to −0.5V from −1.0V, while the voltage potential appliedto the N+ region 124 of the memory cell 12 via the source line (CN) 30may be maintained at 1.1V. The voltage potential applied to the carrierinjection line (EP) 34 may be maintained at 1.0V.

Under such biasing, the junction between the P− region 122 and the N+region 120 may become forward biased. Also, under such biasing, thejunction between the P− region 122 and the N+ region 124 may be reversebiased or become weakly forward biased (e.g., above a reverse biasvoltage and below a forward bias threshold voltage, or a voltagepotential at a p-diffusion region in the P− region 122 may be higherthan a voltage potential at an n-diffusion region in the N+ region 124).A voltage potential or current may be generated when forward biasing thejunction between the P− region 122 and the N+ region 120. The voltagepotential or current generated may be output to a data sense amplifiervia the bit line (EN) 32 coupled to the N+ region 120. An amount ofvoltage potential or current generated may be representative of a datastate (e.g., a logic low (binary “0” data state) and/or a logic high(binary “1” data state)) stored in the memory cell 12.

In an exemplary embodiment, when a logic low (e.g., binary “0” datastate) is stored in the memory cell 12 (e.g., corresponding to the bitline (EN<1>) 32), the junction between the P-region 122 and the N+region 120 may remain reverse biased or become weakly forward biased(e.g., above a reverse bias voltage and below a forward bias thresholdvoltage, or a voltage potential at a p-diffusion region in the P− region122 may be higher than a voltage potential at an n-diffusion region inthe N+ region 124). A small amount of voltage potential or current or novoltage potential or current (e.g., compared to a reference voltagepotential or current) may be generated when the junction between the P−region 122 and the N+ region 120 is reverse biased or weakly forwardbiased. A data sense amplifier in the data write and sense circuitry 36may detect the small amount of voltage potential or current or novoltage potential or current via the bit line (EN<1>) 32 coupled to theN+ region 120.

In another exemplary embodiment, when a logic high (e.g., binary “1”data state) is stored in the memory cell 12 (e.g., corresponding to thebit line (EN<0>) 32), the junction between the P− region 122 and the N+region 120 may be forward biased. A larger amount of voltage potentialor current (e.g., compared to a reference voltage potential or current)may be generated when the junction between the P− region 122 and the N+region 120 is forward biased. A data sense amplifier in the data writeand sense circuitry 36 may detect the larger amount of voltage potentialor current via the bit line (EN<0>) 32 coupled to the N+ region 120.

During one or more active operations (e.g., read operation, writeoperation, sense operation, preparation to start/end operation, and/orrefresh operation), voltage potentials may be applied to every memorycell 12 along an active row via a corresponding word line (WL) 28, acorresponding source line (CN) 30, and/or a corresponding carrierinjection line (EP) 34. However, while the active operations may beperformed on one or more selected memory cells 12 along the active row,one or more unselected memory cells 12 (e.g., corresponding to bit lines(EN<2>) and (EN<3>) 32) along the active row may experience adisturbance caused by the voltage potentials applied via thecorresponding word line (WL) 28, the corresponding source line (CN) 30,and/or the corresponding carrier injection line (EP) 34 during theactive operations. In order to reduce a disturbance experienced by theone or more unselected memory cells 12 (e.g., corresponding to bit lines(EN<2>) and (EN<3>) 32) along the active row, a masking operation may beperformed on the one or more unselected memory cells 12.

In an exemplary embodiment, during a masking operation, a voltagepotential may be applied to the one or more unselected memory cells 12on an active row via corresponding bit lines (EN<2>) and (EN<3>) 32. Thevoltage potential applied via the corresponding bit lines (EN<2>) and(EN<3>) 32 to the one or more unselected memory cells 12 on the activerow may be raised to a predetermined voltage potential. In an exemplaryembodiment, the voltage potential applied to the corresponding bit lines(EN<2>) and (EN<3>) 32 associated with the one or more unselected memorycells 12 along the active row may be 1.1V in order to reduce adisturbance caused by the other voltage potentials applied during theactive operations.

Referring to FIGS. 7A and 7B, there are shown a schematic representationand control signal voltage waveforms for performing a write logic high(e.g., binary “1” data state) operation on a memory cell in accordancewith an embodiment of the present disclosure. The write logic high(e.g., binary “1” data state) operation may involve control signals thatare configured to perform a write logic high (e.g., binary “1” datastate) operation to one or more selected memory cells 12 of one or moreselected rows of the memory cell array 20. For example, the write logichigh (e.g., binary “1” data state) operation may be performed on one ormore selected rows of the memory cell array 20 or the entire memory cellarray 20.

In an exemplary embodiment, during the write logic high (e.g., binary“1” data state) operation, a voltage potential applied to the N+ region120 of a selected memory cell 12 via a corresponding bit line (EN) 32may be maintained at 0V, a voltage potential applied to the P+ region126 of the selected memory cell 12 via a corresponding carrier injectionline (EP) 34 may be maintained at 0.7V, and a voltage potential appliedto the word line (WL) 28 (e.g., capacitively coupled to the P− region122) may be raised to −0.5V from −1.0V. Simultaneously to or subsequentto raising a voltage potential applied to the word line (WL) 28, avoltage potential applied to the source line (CN) 30 may be lowered to0V from 0.7V.

Under such biasing, the junction between the N+ region 120 and the P−region 122 may be reverse biased and the junction between the P+ region126 and the N+ region 124 may become forward biased. A logic high (e.g.,binary “1” data state) may be written to the P− region 122 (e.g.,majority charge carriers injected into the P− region 122 from the P+region 126 via the N+ region 124) via the forward biased junctionbetween the P+ region 126 and the N+ region 124. As more majority chargecarriers accumulate in the P− region 122, the voltage potential at theP− region 122 may increase to approximately 0.7V to 1.0V above thevoltage potential at the N+ region 124. A sufficient amount of majoritycharge carriers may be injected into the P-region 122 to represent thata logic high (e.g., binary “1” data state) is stored in the memory cell12.

Referring to FIGS. 8A and 8B, there are shown a schematic representationand control signal voltage waveforms for performing a write logic high(e.g., binary “1” data state) operation on a memory cell in accordancewith an alternative embodiment of the present disclosure. The writelogic high (e.g., binary “1” data state) operation may involve controlsignals that are configured to perform a write logic high (e.g., binary“1” data state) operation on one or more selected memory cells 12 of oneor more selected rows of the memory cell array 20. For example, thewrite logic high (e.g., binary “1” data state) operation may beperformed on one or more selected rows of the memory cell array 20 orthe entire memory cell array 20.

In an exemplary embodiment, during the write logic high (e.g., binary“1” data state) operation, a voltage potential applied to the N+ region120 of a selected memory cell 12 via a corresponding bit line (EN) 32may be maintained at 0V, a voltage potential applied to the P+ region126 of the selected memory cell 12 via a corresponding carrier injectionline (EP) 34 may be maintained at 1.0V, and a voltage potential appliedto the word line (WL) 28 (e.g., capacitively coupled to the P− region122) may be raised to −0.7V from −1.0V. Simultaneously to or subsequentto raising a voltage potential applied to the word line (WL) 28, avoltage potential applied to the source line (CN) 30 may be lowered to0.3V from 1.0V. Under such biasing, the junction between the N+ region120 and the P− region 122 may be reverse biased and the junction betweenthe P+ region 126 and the N+ region 124 may become forward biased. Alogic high (e.g., binary “1” data state) may be written to the P− region122 (e.g., majority charge carriers injected into the P− region 122 fromthe P+ region 126 via the N+ region 124) via the forward biased junctionbetween the P+ region 126 and the N+ region 124. As more majority chargecarriers accumulate in the P− region 122, the voltage potential at theP− region 122 may increase to approximately 0.7V to 1.0V above thevoltage potential at the N+ region 124. A sufficient amount of majoritycharge carriers may be injected into the P-region 122 to represent thata logic high (e.g., binary “1” data state) is stored in the memory cell12.

Referring to FIGS. 9A and 9B, there are shown a schematic representationand control signal voltage waveforms for performing a write logic low(e.g., binary “0” data state) operation on a memory cell in accordancewith an embodiment of the present disclosure. For example, a write logiclow (e.g., binary “0” data state) operation may involve control signalsthat are configured to perform one or more write operations on one ormore selected memory cells 12. For example, the write logic low (e.g.,binary “0” data state) operation may be performed on one or moreselected memory cells 12 after a write logic high (e.g., binary “1” datastate) operation in order to deplete majority charge carriers that mayhave accumulated in the P− regions 122 of the one or more selectedmemory cells 12.

In an exemplary embodiment, a voltage potential applied to the N+ region120 via the bit line (EN(“0”)) 32 may be maintained at 0V in order toperform the write logic low (e.g., binary “0” data state) operation. Avoltage potential applied to the N+ region 124 via the source line (CN)30 may be raised to 1.1V from 0V in order to perform a write logic low(e.g., binary “0” data state) operation. Subsequent to or simultaneouslyto raising the voltage potential applied to the N+ region 124 via thesource line (CN) 30, a voltage potential applied to the word line (WL)28 may be raised to approximately 0.5V from −1.0V.

Under such biasing, the junction between the N+ region 120 and the P−region 122 may become forward biased. The junction between the N+ region124 and the P− region 122 may become reverse biased or become weaklyforward biased (e.g., above a reverse bias voltage and below a forwardbias threshold voltage, or a voltage potential at a p-diffusion regionin the P-region 122 may be higher than a voltage potential at ann-diffusion region in the N+ region 124). Majority charge carriers thatmay have accumulated in the P− region 122 during a write logic high(e.g., binary “1” data state) operation may be removed via the forwardbiased junction between the N+ region 120 and the P− region 122. Afterremoving the majority charge carriers from the P− region 122, a logiclow (e.g., binary “0” data state) may be written to the memory cell 12.

In order to maintain a logic high (e.g., binary “1” data state) in oneor more unselected memory cells 12 during the write logic low (e.g.,binary “0” data state) operation, a masking operation may be performedon the one or more unselected memory cells 12. For example, a voltagepotential applied to the N+ region 120 via a bit line (EN(“1”)) 32 ofthe one or more unselected memory cells 12 may be raised to 1.1V from0.7V or higher (e.g., 1.2V) in order to prevent the depletion ofmajority charge carriers accumulated in the P− region 122. Under suchbiasing, the junction between the N+ region 120 and the P− region 122may not be forward biased and the junction between the P− region 122 andthe N+ region 124 may not be forward biased in order to prevent thedepletion of majority charge carriers accumulated in the P− region 122so as to allow the logic high (e.g., binary “1” data state) to bemaintained in the memory cell 12.

Referring to FIGS. 10A and 10B, there are shown a schematicrepresentation and control signal voltage waveforms for performing awrite logic low (e.g., binary “0” data state) operation on a memory cellin accordance with an alternative embodiment of the present disclosure.For example, a write logic low (e.g., binary “0” data state) operationmay involve control signals that are configured to perform one or morewrite operations on one or more selected memory cells 12. For example,the write logic low (e.g., binary “0” data state) operation may beperformed on one or more selected memory cells 12 after a write logichigh (e.g., binary “1” data state) operation in order to depletemajority charge carriers that may have accumulated in the P− regions 122of the one or more selected memory cells 12.

In an exemplary embodiment, a voltage potential applied to the N+ region120 via the bit line (EN(“0”)) 32 may be maintained at 0V in order toperform the write logic low (e.g., binary “0” data state) operation. Avoltage potential applied to the N+ region 124 via the source line (CN)30 may be maintained at 1.0V in order to perform a write logic low(e.g., binary “0” data state) operation. A voltage potential applied tothe P+ region 126 via the carrier injection line (EP) 34 may bemaintained at 1.0V. A voltage potential applied to the word line (WL) 28may be raised to approximately 0.5V from −1.0V.

Under such biasing, the junction between the N+ region 120 and the P−region 122 may become forward biased. The junction between the N+ region124 and the P− region 122 may become reverse biased or become weaklyforward biased (e.g., above a reverse bias voltage and below a forwardbias threshold voltage, or a voltage potential at a p-diffusion regionin the P-region 122 may be higher than a voltage potential at ann-diffusion region in the N+ region 124). Majority charge carriers thatmay have accumulated in the P− region 122 during a write logic high(e.g., binary “1” data state) operation may be removed via the forwardbiased junction between the N+ region 120 and the P− region 122. Afterremoving the majority charge carriers from the P− region 122, a logiclow (e.g., binary “0” data state) may be written to the memory cell 12.

In order to maintain a logic high (e.g., binary “1” data state) in oneor more unselected memory cells 12 during the write logic low (e.g.,binary “0” data state) operation, a masking operation may be performedon the one or more unselected memory cells 12. For example, a voltagepotential applied to the N+ region 120 via a bit line (EN(“1”)) 32 ofthe one or more unselected memory cells 12 may be raised to 1.0V from 0Vor higher (e.g., 1.2V) in order to prevent the depletion of majoritycharge carriers accumulated in the P− region 122. Under such biasing,the junction between the N+ region 120 and the P− region 122 may not beforward biased and the junction between the P− region 122 and the N+region 124 may not be forward biased in order to prevent the depletionof majority charge carriers accumulated in the P− region 122 so as toallow the logic high (e.g., binary “1” data state) to be maintained inthe memory cell 12.

At this point it should be noted that providing a direct injectionsemiconductor memory device in accordance with the present disclosure asdescribed above typically involves the processing of input data and thegeneration of output data to some extent. This input data processing andoutput data generation may be implemented in hardware or software. Forexample, specific electronic components may be employed in a directinjection semiconductor memory device or similar or related circuitryfor implementing the functions associated with providing a directinjection semiconductor memory device in accordance with the presentdisclosure as described above. Alternatively, one or more processorsoperating in accordance with instructions may implement the functionsassociated with providing a direct injection semiconductor memory devicein accordance with the present disclosure as described above. If such isthe case, it is within the scope of the present disclosure that suchinstructions may be stored on one or more processor readable media(e.g., a magnetic disk or other storage medium), or transmitted to oneor more processors via one or more signals embodied in one or morecarrier waves.

The present disclosure is not to be limited in scope by the specificembodiments described herein. Indeed, other various embodiments of andmodifications to the present disclosure, in addition to those describedherein, will be apparent to those of ordinary skill in the art from theforegoing description and accompanying drawings. Thus, such otherembodiments and modifications are intended to fall within the scope ofthe present disclosure. Further, although the present disclosure hasbeen described herein in the context of a particular implementation in aparticular environment for a particular purpose, those of ordinary skillin the art will recognize that its usefulness is not limited thereto andthat the present disclosure may be beneficially implemented in anynumber of environments for any number of purposes. Accordingly, theclaims set forth below should be construed in view of the full breadthand spirit of the present disclosure as described herein.

1. A method for biasing a direct injection semiconductor memory devicecomprising the steps of: applying a first voltage potential to a firstN-doped region of the device via a bit line; applying a second voltagepotential to a second N-doped region of the device via a source line;applying a third voltage potential to a word line, wherein the word lineis spaced apart from and capacitively coupled to a body region of thedevice that is electrically floating and disposed between the firstN-doped region and the second N-doped region, wherein the first N-dopedregion, the body region, and the second N-doped region form a bipolartransistor; and applying a fourth voltage potential to a P-typesubstrate of the device via a carrier injection line.
 2. The methodaccording to claim 1, further comprising increasing the third voltagepotential applied to the word line during a hold operation to perform aread operation.
 3. The method according to claim 1, further comprisingincreasing the second voltage potential applied to the source lineduring a hold operation to perform a read operation.
 4. The methodaccording to claim 1, further comprising maintaining the second voltagepotential applied to the source line during a hold operation to performa read operation.
 5. The method according to claim 1, further comprisingincreasing the first voltage potential applied to the bit line during ahold operation in order to reduce a disturbance during a read operation.6. The method according to claim 1, further comprising increasing thethird voltage potential applied to the word line during a hold operationto perform a write logic high operation.
 7. The method according toclaim 1, further comprising lowering the second voltage potentialapplied to the source line during a hold operation to perform a writelogic high operation.
 8. The method according to claim 7, wherein thesecond voltage potential applied to the source line to perform the writelogic high operation is lowered to forward bias a junction between thesecond N-doped region and the P-type substrate.
 9. The method accordingto claim 1, further comprising increasing the third voltage potentialapplied to the word line during a hold operation to perform a writelogic low operation.
 10. The method according to claim 1, furthercomprising increasing the second voltage potential applied to the sourceline during a hold operation to perform a write logic low operation. 11.The method according to claim 1, further comprising maintaining thesecond voltage potential applied to the source line during a holdoperation to perform a write logic low operation.
 12. The methodaccording to claim 1, further comprising maintaining the first voltagepotential applied to the bit line during a hold operation to perform awrite logic low operation.
 13. The method according to claim 1, furthercomprising increasing the first voltage potential applied to the bitline during a hold operation to maintain a logic high stored in thememory cell.
 14. The method according to claim 1, wherein the secondvoltage potential applied to the source line is equal to the fourthvoltage potential applied to the carrier injection line during a holdoperation.
 15. A direct injection semiconductor memory devicecomprising: a first N-doped region coupled to a bit line; a secondN-doped region coupled to a source line; a body region spaced apart fromand capacitively coupled to a word line, wherein the body region iselectrically floating and disposed between the first N-doped region andthe second N-doped region, wherein the first N-doped region, the bodyregion, and the second N-doped region form a bipolar transistor; and aP-type substrate coupled to a carrier injection line.
 16. The directinjection semiconductor memory device according to claim 15, wherein thesecond N-doped region is disposed adjacent the P-type substrate to forma PN junction diode.
 17. The direct injection semiconductor memorydevice according to claim 16, wherein the first N-doped region, the bodyregion, the second N-doped region, and the P-type substrate are formedin a contiguous vertical structure.
 18. A method for biasing a directinjection semiconductor memory device comprising the steps of: applyinga first voltage potential to a first P-doped region of the device via abit line; applying a second voltage potential to a second P-doped regionof the device via a source line; applying a third voltage potential to aword line, wherein the word line is spaced apart from and capacitivelycoupled to a body region of the device that is electrically floating anddisposed between the first P-doped region and the second P-doped region,wherein the first P-doped region, the body region, and the secondP-doped region form a bipolar transistor; and applying a fourth voltagepotential to an N-type substrate of the device via a carrier injectionline.
 19. A direct injection semiconductor memory device comprising: afirst P-doped region coupled to a bit line; a second P-doped regioncoupled to a source line; a body region spaced apart from andcapacitively coupled to a word line, wherein the body region iselectrically floating and disposed between the first P-doped region andthe second P-doped region, wherein the first P-doped region, the bodyregion, and the second P-doped region form a bipolar transistor; and aN-type substrate coupled to a carrier injection line.
 20. The directinjection semiconductor memory device according to claim 19, wherein thesecond P-doped region is disposed adjacent the N-type substrate to forma PN junction diode.
 21. The direct injection semiconductor memorydevice according to claim 20, wherein the first P-doped region, the bodyregion, the second P-doped region, and the N-type substrate are formedin a contiguous vertical structure.
 22. A method for biasing a directinjection semiconductor memory device comprising the steps of: applyinga first voltage potential to a first region of the device via a bitline; applying a second voltage potential to a second region of thedevice via a source line, wherein the second region and the first regionare commonly doped; applying a third voltage potential to a word line,wherein the word line is spaced apart from and capacitively coupled to abody region of the device that is electrically floating and disposedbetween the first region and the second region, wherein the firstregion, the body region, and the second region form a bipolartransistor; and applying a fourth voltage potential to a substrate ofthe device via a carrier injection line.
 23. The method according toclaim 22, wherein the second region is disposed adjacent the substrateto form a PN junction diode.
 24. A direct injection semiconductor memorydevice comprising: a first region coupled to a bit line; a second regioncoupled to a source line, wherein the second region and the first regionare commonly doped; a body region spaced apart from and capacitivelycoupled to a word line, wherein the body region is electrically floatingand disposed between the first region and the second region, wherein thefirst region, the body region, and the second region form a bipolartransistor; and a substrate coupled to a carrier injection line.
 25. Thedirect injection semiconductor memory device according to claim 24,wherein the second region is disposed adjacent the substrate to form aPN junction diode.